ECM will host a custom preparation course at this year’s Coordinate Metrology Society Conference along with TWO separate Level-One CMS Exams; one for Portable 3D Metrologists and one for Traditional CMM Experts. The preparation course is designed to reinforce the student’s knowledge with course objectives mapped to the level-one assessment topic areas for the CMS Metrology Certification Examination. Students can take the exam during the show. CMSC 2023 takes place July 10-14, 2023 in Mobile, AL. If attendees wish to enter the exhibit hall, attend any of the technical presentations, or other conference events in addition to taking this class, they must pay the full cost of the conference. Visit cmsc.org for details on the conference and pricing. (Conference registration includes a one year membership to CMS).
Don’t feel ready to take the certification exam? Find out by taking our new metrologist in training (MIT Assessment) exam. Scroll down for more details.
The course reviews the five broad areas of knowledge considered in the test:
Basic principles in interpreting engineering documents
Effects of equipment and environment on measurement
Factors in establishing a measurement and documentation plan
Measurement Operations
Ethics and Analysis
WHAT IS THE LEVEL-ONE METROLOGY CERTIFICATION EXAMINATION?
The Level-One examination is a proctored and secure online assessment consisting of approximately 200 multiple choice questions covering foundational theory and practice common to most portable (PCMM) and traditional (CMM) 3D Metrology devices. Candidates for this certification must submit an application, meet eligibility requirements, sign the CMS code of ethics, and pass a peer review.
*Register below and select “Level One Portable” or “Level One CMM” prior to your form submission.
WHAT IS THE METROLOGIST IN TRAINING (MIT) EXAMINATION?
The NEW Metrologist in Training test (MIT Assessment) is an internationally approved assessment designed to assist in the development of the skills needed to pass the industry recognized Coordinate Metrology Society (CMS) Certification Exam. The MIT test is modeled on the CMS Level 1 cognitive assessment so that a test taker will experience the same online test environment, and encounter questions distributed across the same body of knowledge as the actual CMS Level 1 – Certification Exam. The test score is broken down by category within the body of knowledge. This will identify to the test taker their strengths and weaknesses within the five major breakout categories outlined in the CMS Certification. A high-score on the MIT test is an indicator that the test taker is on the right path to becoming an expert dimensional metrologist.
*Register below and select MIT Assessment Exam prior to your form submission.
If attendees wish to enter the exhibit hall, attend any of the technical presentations, or other conference events in addition to taking this class, they must pay the full cost of the conference. Visit cmsc.org for details on the conference and pricing.
*IT IS FREE TO SIT IN ON OUR PREPARATORY CLASS WITHOUT TAKING ANY EXAMS, BUT YOU MUST BE A CMS MEMBER. JOIN AT CMSC.ORG
COST TO REGISTER FOR EXAMS:
- LEVEL 1 PORTABLE & CMM EXAMS – $275
- MIT ASSESSMENT EXAM – $100
If you are not able to complete the application process in time for this 2023 conference, or if you simply want to learn more about what is covered in the exam; we encourage you to register for our class at the conference. If your company would prefer to have our training and proctor services travel to your facility to administer the exam post-conference – no problem, ECM can accommodate!
REGISTRATION FOR THIS EVENT IS CLOSED
The class will be held on Tuesday & Wednesday of the Conference from 9:00am-3:00pm (EXAMS ADMINISTERED ON THURSDAY).
